Question
How does atomic force microscopy (AFM) work? Explain briefly with their applications.
Answer :
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Atomic Force Microscopy (AFM) is a high-resolution type of scanning probe microscopy used to study surfaces at the nanoscale. It works by scanning a sharp tip, usually made of silicon or silicon nitride, attached to a flexible cantilever, across the surface of a sample. As the tip interacts with the sample, forces such as van der Waals, electrostatic, or chemical bonding forces cause the cantilever to deflect. These deflections are detected using a laser beam reflected from the top of the cantilever onto a position-sensitive photodetector. The recorded deflections are then converted into a topographical map of the surface with
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